Asset Details
MbrlCatalogueTitleDetail
Do you wish to reserve the book?
Visualization system to identify structurally vulnerable links in OHT railway network in semiconductor FAB using betweenness centrality
by
Park, Youngbin
, Kim, Sehyeon
, Lee, Heewon
, Choi, Yeeun
, Park, Hyunwoo
, Choi, Jinwoo
in
Algorithms
/ Automated guided vehicles
/ Automatic guided vehicles
/ Automation
/ Computation
/ Data visualization
/ Decision making
/ Fabrication
/ Integrated circuit fabrication
/ Links
/ Nodes
/ Parallel processing
/ Port installations
/ Railroads
/ Railway engineering
/ Railway networks
/ Railways
/ Semiconductor industry
/ Semiconductor production equipment
/ Semiconductors
/ Shortest-path problems
/ Social networks
/ Subject specialists
/ Traffic
/ Transportation networks
/ Velocity
/ Visualization
2024
Hey, we have placed the reservation for you!
By the way, why not check out events that you can attend while you pick your title.
You are currently in the queue to collect this book. You will be notified once it is your turn to collect the book.
Oops! Something went wrong.
Looks like we were not able to place the reservation. Kindly try again later.
Are you sure you want to remove the book from the shelf?
Visualization system to identify structurally vulnerable links in OHT railway network in semiconductor FAB using betweenness centrality
by
Park, Youngbin
, Kim, Sehyeon
, Lee, Heewon
, Choi, Yeeun
, Park, Hyunwoo
, Choi, Jinwoo
in
Algorithms
/ Automated guided vehicles
/ Automatic guided vehicles
/ Automation
/ Computation
/ Data visualization
/ Decision making
/ Fabrication
/ Integrated circuit fabrication
/ Links
/ Nodes
/ Parallel processing
/ Port installations
/ Railroads
/ Railway engineering
/ Railway networks
/ Railways
/ Semiconductor industry
/ Semiconductor production equipment
/ Semiconductors
/ Shortest-path problems
/ Social networks
/ Subject specialists
/ Traffic
/ Transportation networks
/ Velocity
/ Visualization
2024
Oops! Something went wrong.
While trying to remove the title from your shelf something went wrong :( Kindly try again later!
Do you wish to request the book?
Visualization system to identify structurally vulnerable links in OHT railway network in semiconductor FAB using betweenness centrality
by
Park, Youngbin
, Kim, Sehyeon
, Lee, Heewon
, Choi, Yeeun
, Park, Hyunwoo
, Choi, Jinwoo
in
Algorithms
/ Automated guided vehicles
/ Automatic guided vehicles
/ Automation
/ Computation
/ Data visualization
/ Decision making
/ Fabrication
/ Integrated circuit fabrication
/ Links
/ Nodes
/ Parallel processing
/ Port installations
/ Railroads
/ Railway engineering
/ Railway networks
/ Railways
/ Semiconductor industry
/ Semiconductor production equipment
/ Semiconductors
/ Shortest-path problems
/ Social networks
/ Subject specialists
/ Traffic
/ Transportation networks
/ Velocity
/ Visualization
2024
Please be aware that the book you have requested cannot be checked out. If you would like to checkout this book, you can reserve another copy
We have requested the book for you!
Your request is successful and it will be processed during the Library working hours. Please check the status of your request in My Requests.
Oops! Something went wrong.
Looks like we were not able to place your request. Kindly try again later.
Visualization system to identify structurally vulnerable links in OHT railway network in semiconductor FAB using betweenness centrality
Journal Article
Visualization system to identify structurally vulnerable links in OHT railway network in semiconductor FAB using betweenness centrality
2024
Request Book From Autostore
and Choose the Collection Method
Overview
In semiconductor fabrication (FAB), wafers are placed into carriers known as Front Opening Unified Pods (FOUPs), transported by the Overhead Hoist Transport (OHT). The OHT, a type of Automated Guided Vehicle (AGV), moves along a fixed railway network in the FAB. The routes of OHTs on the railway network are typically determined by a Single Source Shortest Path (SSSP) algorithm such as Dijkstra’s. However, the presence of hundreds of operating OHTs often leads to path interruptions, causing congestion or deadlocks that ultimately diminish the overall productivity of the FAB. This research focused on identifying structurally vulnerable links within the OHT railway network in semiconductor FAB and developing a visualization system for enhanced on-site decision-making. We employed betweenness centrality as a quantitative index to evaluate the structural vulnerability of the OHT railway network. Also, to accommodate the unique hierarchical node-port structure of this network, we modified the traditional Brandes algorithm, a widely-used method for calculating betweenness centrality. Our modification of the Brandes algorithm integrated node-port characteristics without increasing computation time while incorporating parallelization to reduce computation time further and improve usability. Ultimately, we developed an end-to-end web-based visualization system that enables users to perform betweenness centrality calculations on specific OHT railway layouts using our algorithm and view the results through a web interface. We validated our approach by comparing our results with historically vulnerable links provided by Samsung Electronics. The study had two main outcomes: the development of a new betweenness centrality calculation algorithm considering the node-port structure and the creation of a visualization system. The study demonstrated that the node-port structure betweenness centrality effectively identified vulnerable links in the OHT railway network. Presenting these findings through a visualization system greatly enhanced their practical applicability and relevance.
Publisher
Public Library of Science
Subject
This website uses cookies to ensure you get the best experience on our website.